Описание

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

Отзывы ( 0 )
Раз в месяц дарим подарки самому активному читателю.
Оставляйте больше отзывов, и мы наградим вас!
Цитаты (0)
Вы можете первыми опубликовать цитату

Топ