Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations.Practical examples are taken from:inorganic layered materialsorganic conductorsorganic adsorbates at liquid-solid interfacesself-assembled amphiphilespolymersThis book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.

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